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Conference VDAT (Symposium) (22nd : 2018 : Madurai, India)
Title VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
Imprint Singapore : Springer, 2019.

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Conference VDAT (Symposium) (22nd : 2018 : Madurai, India)
Series Communications in computer and information science, 1865-0929 ; 892.
Communications in computer and information science ; 892. 1865-0929.
Subject Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.
Alt Name Rajaram, S., 1973-
Balamurugan, N. B.,
Gracia Nirmala Rani, D.,
Singh, Virendra (Associate professor of electrical engineering),
Add Title VDAT 2018
Description 1 online resource (xviii, 722 pages) : illustrations (some color).
polychrome rdacc
Note Includes author index.
Online resource; title from PDF title page (SpringerLink, viewed January 29, 2019).
Contents Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
Summary This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
ISBN 9789811359507 (electronic bk.)
9811359504 (electronic bk.)
9789811359491 (print)
ISBN/ISSN 10.1007/978-981-13-5950-7
OCLC # 1083544208


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