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Title Acoustic scanning probe microscopy / Francesco Marinello, Daniele Passeri, Enrico Savio, editors.
Imprint Berlin ; New York : Springer, 2013.

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Series NanoScience and technology, 1434-4904
Nanoscience and technology.
Subject Scanning probe microscopy.
Acoustic microscopy.
Alt Name Marinello, Francesco.
Passeri, Daniele.
Savio, Enrico.
Description 1 online resource.
polychrome rdacc
Contents Acoustic Scanning Probe Microscopy: An Overview / D. Passeri and F. Marinello -- Contact, Interactions, and Dynamics / E. Barthel -- Cantilever Dynamics: Theoretical Modeling / John H. Cantrell and Sean A. Cantrell -- One-Dimensional Finite Element Modeling of AFM Cantilevers / Richard Arinero and Gerard Leveque -- Atomic Force Acoustic Microscopy / U. Rabe, M. Kopycinska-Muller and S. Hirsekorn -- Ultrasonic Atomic Force Microscopy UAFM / Kazushi Yamanaka and Toshihiro Tsuji -- Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers / Mikio Muraoka -- Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology / P. Vairac, J. Le Rouzic, P. Delobelle and B. Cretin -- Ultrasonic Force Microscopies / Oleg Kolosov and Andrew Briggs -- Scanning Near-Field Ultrasound Holography / Shraddha Avasthy, Gajendra S. Shekhawat and Vinayak P. Dravid -- Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy / Andrzej Sikora and ukasz Bednarz -- Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques / D.C. Hurley -- Data Processing for Acoustic Probe Microscopy Techniques / F. Marinello, D. Passeri, P. Schiavuta and E. Savio -- Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy / A. Caron and W. Arnold -- Quantitative Subsurface Imaging by Acoustic AFM Techniques / Zehra Parlak and Levent F. Degertekin -- Polymer Material Characterization by Acoustic Force Microscopy / Chad S. Korach -- Application of Acoustic Techniques for Characterization of Biological Samples / Bernhard R. Tittmann and Anne Ebert.
Bibliography Note Includes bibliographical references and index.
Summary The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
ISBN 9783642274947 (electronic bk.)
3642274943 (electronic bk.)
ISBN/ISSN 10.1007/978-3-642-27494-7
OCLC # 813838370
Additional Format Print version: 9783642274930