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Author Kaupp, G. (Gerd)
Title Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.
Imprint Berlin : Springer-Verlag, 2006.

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Author Kaupp, G. (Gerd)
Series Nanoscience and technology, 1434-4904
Nanoscience and technology. 1434-4904
Subject Atomic force microscopy.
Near-field microscopy.
Medical Laboratory Science.
Microscopy, Atomic Force.
Microscopy, Scanning Probe.
Nanotechnology.
Description 1 online resource (xii, 292 pages) : illustrations.
polychrome rdacc
Bibliography Note Includes bibliographical references and index.
Contents Cover -- Contents -- 1 Atomic Force Microscopy -- 1.1 Introduction -- 1.2 Basics of Contact AFM -- 1.3 Instrumental -- 1.4 Validity Checks -- 1.5 Artifacts -- 1.6 Surface Scratching and Plowing, Liquids on the Surface -- 1.7 Molecular Steps -- 1.8 Ambient Surface Modifications -- 1.9 Chemical Surface Modeling and Typical Shapes of Topologic Features -- 1.9.1 Volcano or Cone Type -- 1.9.2 Islands -- 1.9.3 Craters -- 1.9.4 Pool Basin Type -- 1.9.5 Prismatic Floes -- 1.9.6 Heights and Valleys -- 1.9.7 Fissures -- 1.9.8 Bricks -- 1.10 Shear-Force AFM -- 1.11 Further Fields of Practical Application -- 1.11.1 Biology and Medicine -- 1.11.2 Pharmacy -- 1.11.3 Polymers -- 1.11.4 Ceramics -- 1.11.5 Mineralogy and Geology -- 1.11.6 Metallurgy and Corrosion -- 1.11.7 Catalysis -- 1.11.8 Forensics -- 1.11.9 Historical Objects -- 1.12 Electromagnetic AFM -- 1.13 Conclusions -- References -- 2 Scanning Near-Field Optical Microscopy -- 2.1 Introduction -- 2.2 Foundations of SNOM -- 2.3 Equipment -- 2.4 Optical Resolution -- 2.5 Dependence of the Reflectance Enhancement from the Shear Force -- 2.6 Artifacts -- 2.6.1 Tip Breakage During Scanning -- 2.6.2 Stripes Contrast -- 2.6.3 Inverted Derivative of the Topology in the Optical Response -- 2.6.4 Inverted Contrast -- 2.6.5 Displaced Optical Contrast -- 2.6.6 Local Far-Field Light Concentration -- 2.6.7 Topologic Artifacts -- 2.7 Application of SNOM in Solid-State Chemistry -- 2.8 Physical-State SNOM Contrast -- 2.9 Technical Applications -- 2.9.1 SNOM on Dental Alloys -- 2.9.2 SNOM on Glazed Paper -- 2.9.3 SNOM on Blood Bags -- 2.9.4 Quality Assessment of Metal Sol Particles for SERS by SNOM -- 2.10 Applications of SNOM in Biology and Medicine -- 2.10.1 Prehistoric Bacterium, Pyrite Formation upon Petrification -- 2.10.2 SNOM on a Human Tooth -- 2.10.3 SNOM on Polymer Beads -- 2.10.4 SNOM on Cryo Microtome Cuts of Rabbit Heart [61] -- 2.10.5 SNOM on Stained and Unstained Shrimp Eye Preparations [61] -- 2.10.6 SNOM in Cancer Research [61] -- 2.11 Near-Field Spectroscopy -- 2.11.1 Direct Local Raman SNOM -- 2.11.2 SERS SNOM -- 2.11.3 Near-Field Infrared Spectroscopy and Scanning Near-Field Dielectric Microscopy -- 2.11.4 Fluorescence SNOM -- 2.12 Nanophotolithography -- 2.13 Digital Microscopy for Rough Surfaces -- 2.14 Conclusions -- References -- 3 Nanoindentation -- 3.1 Introduction -- 3.2 Equipment -- 3.3 Foundations of the Nanoindentation Technique -- 3.3.1 General Remarks -- 3.3.2 Load-Displacement Curves -- 3.3.3 Anisotropy and Far-Reaching Response -- 3.4 Elastic and Plastic Parameters -- 3.4.1 Nanohardness -- 3.4.2 Reduced Elastic Modulus -- 3.4.3 Contact Area and Contact Height -- 3.4.4 Stiffness and Compliance -- 3.4.5 The Unloading Iteration Process -- 3.5 Improved Indentation Parameters -- 3.6 Linear Plots for the Loadi.
Summary "Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm." "New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples."--Jacket.
Note Print version record.
ISBN 9783540284727
3540284729
3540284052 (hd. bd.)
9783540284055
6610657173
9786610657179
ISBN/ISSN 10.1007/978-3-540-28472-7
OCLC # 262692112
Additional Format Print version: Kaupp, G. (Gerd). Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching. Berlin : Springer-Verlag, 2006 3540284052 9783540284055 (DLC) 2006923691 (OCoLC)71008043


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