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Title Atomic scale interconnection machines : proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011 / Christian Joachim, editor.
Imprint Berlin ; New York : Springer, 2012.

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Series Advances in atom and single molecule machines, 2193-9691
Advances in atom and single molecule machines.
Subject Nanotechnology -- Congresses.
Alt Name Joachim, C.
LOCATION CALL # STATUS MESSAGE
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Series Advances in atom and single molecule machines, 2193-9691
Advances in atom and single molecule machines.
Subject Nanotechnology -- Congresses.
Alt Name Joachim, C.
Description 1 online resource (ix, 242 pages) : color illustrations.
polychrome rdacc
Bibliography Note Includes bibliographical references.
Contents High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects / B. Guenther, M. Maier, J. Koeble, A. Bettac and F. Matthes, et al. -- Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm / Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte and Marcus Blab, et al. -- Atomic Scale Interconnection Machine / O.A. Neucheva, R. Thamankar, T.L. Yap, C. Troadec and J. Deng, et al. -- The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate / D. Martrou, L. Guiraud, R. Laloo, B. Pecassou and P. Abeilhou, et al. -- Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System / Zhouhang Wang -- On the Road to Multi-Probe Non-Contact AFM / T. Vancura, S. Schmitt, V. Friedli, S. Torbrugge and O. Schaff -- Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact / John N. Randall, James R. Von Ehr, Joshua Ballard, James Owen and Rahul Saini, et al. -- Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires / M. Berthe, C. Durand, T. Xu, J.P. Nys and P. Caroff, et al. -- Probing Electronic Transport of Individual Nanostructures with Atomic Precision / Shengyong Qin and An-Ping Li.
Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System / R. Thamankar, O.A. Neucheva, T.L. Yap and C. Joachim -- Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing / M. Wojtaszek, M. Kolmer, S. Godlewski, J. Budzioch and B. Such, et al. -- Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM / S. Hasegawa, T. Hirahara, Y. Kitaoka, S. Yoshimoto and T. Tono, et al. -- Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope / Janik Zikovsky, Mark H. Salomons, Stanislav A. Dogel and Robert A. Wolkow -- Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy / J.A. Miwa and M.Y. Simmons -- Electronic Transport on the Nanoscale / C.A. Bobisch, A.M. Bernhart, M.R. Kaspers, M.C. Cottin and J. Schaffert, et al. -- Solid State Nano Gears Manipulations / Cedric Troadec, Jie Deng, Francisco Ample, Ramesh Thamankar and Christian Joachim -- Probing Single Molecular Motors on Solid Surface / Haiming Guo, Yeliang Wang, Min Feng, Li Gao and Hongjun Gao.
Summary Annotation This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.
ISBN 9783642281723 (electronic bk.)
3642281729 (electronic bk.)
3642281710
9783642281716
OCLC # 793003110
Additional Format Print version: Joachim, Christian. Atomic Scale Interconnection Machines : Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011. Dordrecht : Springer, 2012 9783642281716


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