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LEADER 00000cam  2200601Ii 4500 
001    186545122 
003    OCoLC 
005    20181130031327.4 
006    m     o  d         
007    cr cn||||||||| 
008    080102s2007    nyua    ob    001 0 eng d 
019    234238470|a316687232|a317485681|a558484137|a607255374
020    9780387381527 
020    038738152X 
020    9780387381510|q(hbk.) 
020    0387381511|q(hbk.) 
024 7  10.1007/978-0-387-38152-7|2doi 
035    (OCoLC)186545122|z(OCoLC)234238470|z(OCoLC)316687232
037    978-0-387-38151-0|bSpringer|n 
040    GW5XE|beng|epn|erda|cGW5XE|dGW5XE|dYDXCP|dTEX|dOCLCQ|dCEF
049    MAIN 
050  4 TK7874.58|b.C37 2007eb 
072  7 TEC|x008010|2bisacsh 
072  7 TJFC|2bicssc 
072  7 TEC|x008020|2bisacsh 
082 04 621.381548|222 
100 1  Carter, Hamilton B. 
245 10 Metric-driven design verification :|ban engineer's and 
       executive's guide to first pass success /|cHamilton B. 
       Carter, Shankar Hemmady. 
264  1 New York :|bSpringer,|c2007. 
300    1 online resource (xxvii, 361 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc|0
347    text file|2rdaft|0
504    Includes bibliographical references and index. 
505 0  Analyzing And Driving Verification: An Executive's Guide -
       - The Verification Crisis -- Automated Metric-Driven 
       Processes -- Roles in a Verification Project -- Overview 
       of a Verification Project -- Verification Technologies -- 
       Managing The Verification Process -- Verification Planning
       -- Capturing Metrics -- Regression Management -- Revision 
       Control and Change Integration -- Debug -- Executing The 
       Verification Process -- Coverage Metrics -- Modeling and 
       Architectural Verification -- Assertion-Based Verification
       -- Dynamic Simulation-Based Verification -- System 
       Verification -- Mixed Analog and Digital Verification -- 
       Design for Test -- Case Studies And Commentaries -- Metric
       -Driven Design Verification: Why Is My Customer a Better 
       Verification Engineer Than Me? -- Metric-Driven 
       Methodology Speeds the Verification of a Complex Network 
       Processor -- Developing a Coverage-Driven SoC Methodology 
       -- From Panic-Driven to Plan-Driven Verification Managing 
       the Transition -- Verification of a Next-Generation Single
       -Chip Analog TV and Digital TV ASIC -- Management IP: New 
       Frontier Providing Value Enterprise-Wide -- Adelante 
       VD3204x Core, SubSystem, and SoC Verification -- SystemC-
       based Virtual SoC: An Integrated System-Level and Block-
       Level Verification Approach from Simulation to Coemulation
       -- Is Your System-Level Project Benefiting from 
       Collaboration or Headed to Chaos? 
520 1  "Exponentially increasing design complexity has 
       necessitated the adoption of metric driven planning and 
       project management. Metric Driven Design Verification 
       provides the semiconductor industry's first metric driven 
       based approach to functional verification." "Metric Driven
       Design Verification brings together the best practices and
       real-life experiences of several leading electronic 
       companies worldwide in planning and managing verification 
       projects, while automating critical processes. It 
       addresses all aspects of verification and summarizes the 
       different options available to engineers, managers and 
588 0  Print version record. 
650  0 Integrated circuits|xVerification.|0
650 14 Engineering. 
650 24 Circuits and Systems. 
650 24 Electrical Engineering. 
650 24 Electronics and Microelectronics, Instrumentation. 
655  4 Electronic books. 
700 1  Hemmady, Shankar. 
776 08 |iPrint version:|aCarter, Hamilton B.|tMetric-driven 
       design verification.|dNew York : Springer, 2007
       |z9780387381510|z0387381511|w(DLC)  2007924215
990    SpringerLink|bSpringer English/International eBooks 2007 -
       Full Set|c2018-10-31|yNew collection 
990    SpringerLink|bSpringer English/International eBooks 2007 -
       Full Set|c2018-11-30|yMaster record variable field(s) 
       change: 650|5OH1 
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