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Author Kuch, Wolfgang,
Title Magnetic microscopy of layered structures / Wolfgang Kuch, Rudolf Schafer, Peter Fischer, Franz Ulrich Hillebrecht.
Imprint Heidelberg : Springer, [2014]

View online
View online
Author Kuch, Wolfgang,
Series Springer Series in Surface Sciences, 0931-5195 ; volume 57
Springer series in surface sciences ; 57.
Subject Microscopy -- Technique.
Alt Name Schäfer, Rudolf,
Fischer, Peter (Professor in Physics),
Hillebrecht, Franz Ulrich,
Description 1 online resource (xi, 246 pages) : illustrations (some color).
polychrome rdacc
Bibliography Note Includes bibliographical references and index.
Contents Preface; Acknowledgments; Contents; 1 Introduction; 1.1 Layered Magnetic Structures; 1.1.1 Magnetoresistive Devices; 1.1.2 Spintronics; 1.1.3 Ferromagnetic -- Antiferromagnetic Heterostructures; 1.1.4 Need for Layer-Resolved Information; 1.1.5 Need for Time Resolution; 1.2 Approaches to Layer-Resolved Magnetic Imaging; 1.2.1 Interference-Based Approach; 1.2.2 Electronic Properties-Based Approach; 2 Magneto-Optical Effects; 2.1 Overview; 2.2 Optical Basics of Conventional Effects; 2.2.1 Wave Equation; 2.2.2 Polarized Light; 2.2.3 Birefringence, Dichroism, and Optical Activity.
2.2.4 The Compensator2.2.5 Reflection and Transmission of Polarized Light; 2.3 Electromagnetic Basics of Conventional Effects ; 2.3.1 The Dielectric Permittivity Tensor; 2.3.2 Solutions; 2.4 Faraday and Kerr Effect ; 2.4.1 Phenomenological Description; 2.4.2 Geometry of the Rotation Effects; 2.4.3 Kerr Contrast and Signal; 2.4.4 Microscopic Origin of the Kerr Effect; 2.5 Voigt Effect; 2.6 Gradient Effect; 2.7 X-Ray Magnetic Dichroism; 2.7.1 X-Ray Magnetic Linear Dichroism; 2.7.2 Circularly Polarized X-rays; 2.7.3 X-Ray Magnetic Circular Dichroism.
3 Depth-Sensitive Conventional Magneto-Optical Microscopy3.1 Magneto-Optical Microscopy and Magnetometry; 3.1.1 Wide-Field Microscopy; 3.1.2 Laser-Scanning Microscopy; 3.1.3 Magneto-Optical Magnetometry and Ellipsometry; 3.2 Depth Sensitivity of Conventional Magneto-Optics; 3.2.1 Experimental Proof of Depth Sensitivity; 3.2.2 Theoretical Approaches to Depth Sensitivity in Magneto-Optics; 3.2.3 Depth Sensitivity Function; 3.2.4 Depth Sensitivity in Magnetic Films; 3.2.5 Depth Sensitivity in Magnetic Multilayers; 3.2.6 Depth Selectivity in Magnetic Multilayers.
3.3 Depth-Selective Kerr Microscopy3.4 Voigt- and Gradient Microscopy; 4 Depth-Sensitive Photoelectron Emission Microscopy; 4.1 Photoelectron Emission Microscopy; 4.2 Electron Yield Detection of Absorption from Buried Layers; 4.3 Imaging Ferromagnetic Materials by X-ray Magnetic Circular Dichroism; 4.3.1 NiFe/Cu/Co Trilayers; 4.3.2 Co/Cu/Ni Trilayers; 4.3.3 NiFe/Al2O3/Co Trilayers; 4.3.4 Ni/Fe/Co Trilayers; 4.3.5 Ni/FeMn/Co Trilayers; 4.4 Imaging Antiferromagnetic Materials by X-ray Magnetic Linear Dichroism.
4.4.1 Magnetic Linear Dichroism as Contrast Mechanism for Layer-Resolved Magnetic Imaging Using PEEM4.4.2 Exchange Coupling at the Interface of NiO and a Ferromagnetic Metal; 4.4.3 CoO/NiO Heterostructures; 4.4.4 Co/LaFeO3 Heterostructures; 4.5 Time- and Layer-Resolved Magnetic Imaging by XMCD-PEEM; 5 Magnetic Transmission Soft X-Ray Microscopy; 5.1 Introduction; 5.2 Absorption of X Rays in Transmission Experiments ; 5.3 Basic Elements in Magnetic Transmission Soft X-Ray Microscopy ; 5.3.1 Fresnel Zone Plates as Optical Elements ; 5.3.2 Experimental Set-Up; 5.3.3 Sample Properties.
Summary This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles o.
Note Online resource; title from PDF title page (SpringerLink, viewed December 17, 2014).
ISBN 9783662445327 (electronic bk.)
3662445328 (electronic bk.)
ISBN/ISSN 10.1007/978-3-662-44532-7
OCLC # 894554163
Additional Format Print version: Kuch, Wolfgang. Magnetic Microscopy of Layered Structures. Berlin, Heidelberg : Springer Berlin Heidelberg, 2014 9783662445310

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