| Subject |
Mass spectrometry.
|
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Spectrum analysis.
|
| Alt Name |
Smoluch, Marek, 1977-
|
|
Grasso, Giuseppe, 1974-
|
|
Suder, Piotr, 1949-
|
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Silberring, Jerzy, 1949-
|
| Description |
1 online resource (xxi, 418 pages) |
|
polychrome rdacc |
| Edition |
Second edition / edited by Marek Smoluch, Giuseppe Grasso, Piotr Suder, and Jerzy Silberring. |
| Bibliography Note |
Includes bibliographical references and index. |
| Contents |
Intro; Title Page; Copyright Page; Contents; List of Contributors; Preface; Chapter 1 Introduction; Chapter 2 A Brief History of Mass Spectrometry; Chapter 3 Basic Definitions; Chapter 4 Instrumentation; 4.1 Ionization Methods; 4.1.1 Electron Ioniza tion (EI); 4.1.2 Chemical Ionizatio n (CI); 4.1.2.1 Principle of Operation: Positive and Negative Ion Modes; 4.1.3 Atmospheric Pressure Ionization (API); 4.1.3.1 Atmospheric Pressure Chemical Ionization (APCI); 4.1.3.2 Electrospray Ionization (ESI); 4.1.3.3 Nanoelectrospray; 4.1.3.4 Desorption Electrospray Ionization (DESI) |
|
4.1.3.5 Laser Ablation Electrospray Ionization (LAESI)4.1.3.6 Photoionization; 4.1.4 Ambient Plasma-Based Ionization Techniques; 4.1.4.1 Introduction; 4.1.4.2 Direct Analysis in Real Time (DART); 4.1.4.3 Flowing Atmospheric Pressure Afterglow (FAPA); 4.1.4.4 Dielectric Barrier Discharge Ionization (DBDI); 4.1.5 Matrix-Assisted Laser Desorption/Ionization (MALDI); 4.1.5.1 Introduction; 4.1.5.2 The Role of Matrix; 4.1.5.3 Atmospheric Pressure MALDI; 4.1.5.4 MALDI Mass Spectra Interpretation; 4.1.5.5 Desorption/Ionization on Porous Silicon (DIOS) |
|
4.1.5.6 Surface-Enhanced Laser Desorption/Ionization (SELDI)4.1.5.7 Nanostructure-Enhanced Laser Desorption/Ionization (NALDI); 4.1.5.8 Summary; 4.1.6 Inductively Coupled Plasma Ionization (ICP); 4.1.6.1 Introduction; 4.1.6.2 ICP as a Technique of Elemental Analysis and ICP Principle; 4.1.6.3 Ionization of Elements and Ionization Efficiency; 4.1.6.4 Mechanism of ICP Formation; 4.1.6.5 Ways of Plasma View and Plasma Generation; 4.1.6.6 Sample Introduction; 4.1.6.7 Measurement in the ICP-MS Technique; 4.1.6.8 Analyzers in ICP-MS Spectrometers |
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4.1.7 Secondary Ion Mass Spectrometry with Time-of-FlightAnalyzer (TOF-SIMS)4.1.7.1 Introduction; 4.1.7.2 TOF-SIMS Principle of Operation; 4.1.7.3 The Sputtering of the Sample Surface; 4.1.7.4 Ionization (Generating Secondary Ions); 4.1.7.5 Construction of TOF-SIMS; 4.1.7.6 Analytical Capabilities of TOF-SIMS; 4.1.7.7 Examples and Spectra Interpretation; 4.2 Analyzers; 4.2.1 Time of Flight (TOF); 4.2.1.1 Introduction; 4.2.1.2 The Working Rule of TOF Analyzer; 4.2.1.3 Linear Mode of Operation of TOF; 4.2.1.4 The Spread of the Kinetic Energy Regarding the Ions of the Same Mass |
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4.2.1.5 Delayed Ion Extraction4.2.1.6 The Reflection Mode; 4.2.1.7 Orthogonal Acceleration TOF Analyzer; 4.2.1.8 Summary; 4.2.2 Ion Mobility Analyzer (IM); 4.2.2.1 Principle of IM Operation; 4.2.2.2 Drift Time IMS; 4.2.2.3 High Field Asymmetric Waveform Ion Mobility Spectrometer (FAIMS); 4.2.2.4 Traveling Wave Ion Guides (TWIG); 4.2.2.5 IM Spectrum; 4.2.2.6 Applications; 4.2.3 Quadrupole Mass Analyzer; 4.2.3.1 Construction and Principles of Operation of a Quadrupole; 4.2.3.2 Behavior of an Ion Inside the Quadrupole; 4.2.3.3 How Mass Spectrum Is Generated? Changes of U and V |
| Note |
Online resource; title from digital title page (viewed on August 06, 2019). |
| ISBN |
9781119377337 (electronic book) |
|
1119377331 (electronic book) |
|
9781119377368 (electronic book) |
|
1119377366 (electronic book) |
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9781119377344 (electronic publication) |
|
111937734X |
|
9781119377306 (hardcover) |
| OCLC # |
1090282496 |
| Additional Format |
Print version: Mass spectrometry. Second edition / edited by Marek Smoluch, Giuseppe Grasso, Piotr Suder, Jerzy Silberring. Hoboken, NJ : Wiley, 2019 9781119377306 (DLC) 2019011643 |
|
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