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Title Mass spectrometry : an applied approach.
Imprint Hoboken, NJ : Wiley, 2019.
Edition Second edition / edited by Marek Smoluch, Giuseppe Grasso, Piotr Suder, and Jerzy Silberring.

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Subject Mass spectrometry.
Spectrum analysis.
Alt Name Smoluch, Marek, 1977-
Grasso, Giuseppe, 1974-
Suder, Piotr, 1949-
Silberring, Jerzy, 1949-
Description 1 online resource (xxi, 418 pages)
polychrome rdacc
Edition Second edition / edited by Marek Smoluch, Giuseppe Grasso, Piotr Suder, and Jerzy Silberring.
Bibliography Note Includes bibliographical references and index.
Contents Intro; Title Page; Copyright Page; Contents; List of Contributors; Preface; Chapter 1 Introduction; Chapter 2 A Brief History of Mass Spectrometry; Chapter 3 Basic Definitions; Chapter 4 Instrumentation; 4.1 Ionization Methods; 4.1.1 Electron Ioniza tion (EI); 4.1.2 Chemical Ionizatio n (CI); Principle of Operation: Positive and Negative Ion Modes; 4.1.3 Atmospheric Pressure Ionization (API); Atmospheric Pressure Chemical Ionization (APCI); Electrospray Ionization (ESI); Nanoelectrospray; Desorption Electrospray Ionization (DESI) Laser Ablation Electrospray Ionization (LAESI) Photoionization; 4.1.4 Ambient Plasma-Based Ionization Techniques; Introduction; Direct Analysis in Real Time (DART); Flowing Atmospheric Pressure Afterglow (FAPA); Dielectric Barrier Discharge Ionization (DBDI); 4.1.5 Matrix-Assisted Laser Desorption/Ionization (MALDI); Introduction; The Role of Matrix; Atmospheric Pressure MALDI; MALDI Mass Spectra Interpretation; Desorption/Ionization on Porous Silicon (DIOS) Surface-Enhanced Laser Desorption/Ionization (SELDI) Nanostructure-Enhanced Laser Desorption/Ionization (NALDI); Summary; 4.1.6 Inductively Coupled Plasma Ionization (ICP); Introduction; ICP as a Technique of Elemental Analysis and ICP Principle; Ionization of Elements and Ionization Efficiency; Mechanism of ICP Formation; Ways of Plasma View and Plasma Generation; Sample Introduction; Measurement in the ICP-MS Technique; Analyzers in ICP-MS Spectrometers
4.1.7 Secondary Ion Mass Spectrometry with Time-of-FlightAnalyzer (TOF-SIMS) Introduction; TOF-SIMS Principle of Operation; The Sputtering of the Sample Surface; Ionization (Generating Secondary Ions); Construction of TOF-SIMS; Analytical Capabilities of TOF-SIMS; Examples and Spectra Interpretation; 4.2 Analyzers; 4.2.1 Time of Flight (TOF); Introduction; The Working Rule of TOF Analyzer; Linear Mode of Operation of TOF; The Spread of the Kinetic Energy Regarding the Ions of the Same Mass Delayed Ion Extraction4.2.1.6 The Reflection Mode; Orthogonal Acceleration TOF Analyzer; Summary; 4.2.2 Ion Mobility Analyzer (IM); Principle of IM Operation; Drift Time IMS; High Field Asymmetric Waveform Ion Mobility Spectrometer (FAIMS); Traveling Wave Ion Guides (TWIG); IM Spectrum; Applications; 4.2.3 Quadrupole Mass Analyzer; Construction and Principles of Operation of a Quadrupole; Behavior of an Ion Inside the Quadrupole; How Mass Spectrum Is Generated? Changes of U and V
Note Online resource; title from digital title page (viewed on August 06, 2019).
ISBN 9781119377337 (electronic book)
1119377331 (electronic book)
9781119377368 (electronic book)
1119377366 (electronic book)
9781119377344 (electronic publication)
9781119377306 (hardcover)
OCLC # 1090282496
Additional Format Print version: Mass spectrometry. Second edition / edited by Marek Smoluch, Giuseppe Grasso, Piotr Suder, Jerzy Silberring. Hoboken, NJ : Wiley, 2019 9781119377306 (DLC) 2019011643

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