Return to home page
Searching: Otterbein library catalog
Some OPAL libraries remain closed or are operating at reduced service levels. Materials from those libraries may not be requestable; requested items may take longer to arrive. Note that pickup procedures may differ between libraries. Please contact your library for new procedures, specific requests, or other assistance.
  Previous Record Previous Item Next Item Next Record
  Reviews, Summaries, etc...
EBOOK
Author Rein, S. (Stefan)
Title Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / S. Rein.
Imprint Berlin ; New York : Springer, 2005.

LOCATION CALL # STATUS MESSAGE
 OHIOLINK SPRINGER EBOOKS    ONLINE  
View online
LOCATION CALL # STATUS MESSAGE
 OHIOLINK SPRINGER EBOOKS    ONLINE  
View online
Author Rein, S. (Stefan)
Series Springer series in materials science, 0933-033X ; 85
Springer series in materials science ; v. 85.
Subject Silicon crystals -- Defects.
Silicon crystals -- Spectra.
Semiconductors -- Defects.
Description 1 online resource (xxvi, 489 pages) : illustrations (some color).
polychrome rdacc
Bibliography Note Includes bibliographical references and index.
Summary Annotation Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
Contents Theory of carrier lifetime in silicon -- Lifetime measurement techniques -- Theory of lifetime spectroscopy -- Defect characterization on intentionally metal-contaminated silicon samples -- The metastable defect in boron-doped Czochralski silicon -- Summary and further work -- Zusammenfassung und Ausblick.
Note Print version record.
ISBN 9783540279228
3540279229
9781615833818 (electronic bk.)
1615833811 (electronic bk.)
9783540253037
3540253033
6610308446
9786610308446
ISBN/ISSN 9783540253037
OCLC # 209869397
Link Springer e-books
Additional Format Print version: Rein, S. (Stefan). Lifetime spectroscopy. Berlin ; New York : Springer, 2005 3540253033 9783540253037 (OCoLC)60800803


If you experience difficulty accessing or navigating this content, please contact the OPAL Support Team